@Article{ LOZANO_UNNO:736-742,

author = { JOSE JULIO LOZANO BAHILO and Y. UNNO ET AL. } ,

title = { BEAM TEST OF A LARGE AREA N-ON-N SILICON STRIP DETECTOR WITH FAST BINARY READOUT ELECTRONICS },

journal = { I E E E TRANSACTIONS ON NUCLEAR SCIENCE: (INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, INC.) },

year = { 1997 },

volume = { 44 },

issn = { 0018-9499 },

pages = { 736-742 },

}