@Article{ LOZANO_Unno-Et:736-742,

author = { JOSE JULIO LOZANO BAHILO and Y. Unno-Et Al. } ,

title = { BEAM TEST OF A LARGE AREA N-ON-N SILICON STRIP DETECTOR WITH FAST BINARY READOUT ELECTRONICS },

journal = { IEEE Transactions on Nuclear Science },

year = { 1997 },

volume = { 44 },

pages = { 736-742 },

}